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0 索取号:TN304.83/E801/9.1 作者:International Conference on Amorphous and Liquid Semiconductors (9th : 1981 : Grenoble、 France)、Chakraverty、 B. K.、Kaplan、 D.、International Union of Pure and Applied Physics.、 出版社:[Paris] : Éditions de physique, 1981.
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0 索取号:TN304.23-53/E701/1966 作者: 出版社:London : Institute of Physics & the Physical Society, 1967].
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0 索取号:F0/E20042 作者:Schneider、 Friedrich.、Enste、 Dominik.、 出版社:Cambridge ; New York : Cambridge University Press, 2002.
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0 索取号:TN27-53/E801 作者:Symposium on Current Mathematical Problems in Image Science (1976 : Monterey、 Calif.)、Wilde、 Carroll O.、Barrett、 Eamon.、 出版社:North Hollywood, Calif. : Western Periodicals Co., 1977.
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0 索取号:TN24-53/E909/1982 作者:International Conference on Lasers (1982 : New Orleans、 La.)、Powell、 Richard C. (Richard Conger)、 1939-、Society for Optical & Quantum Electronics.、 出版社:McLean, VA : STS Press, 1982 [i.e. 1983].
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0 索取号:TN201-53/E901/14 作者:International Quantum Electronics Conference (14th : 1986 : San Francisco、 Calif.)、American Physical Society.、Lasers and Electro-optics Society (Institute of Electrical and Electronics Engineers)、Optical Society of America.、 出版社:[Washington, D.C.] : Optical Society of America, 1986.
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0 索取号:TN1-53/E906 作者:International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、 出版社:Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984
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0 索取号:TN06-53/E801/11 作者:International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
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0 索取号:TN06-53/E801/10 作者:International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.
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0 索取号:TN06-53/E801/9 作者:International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
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0 索取号:TN1-53/E805 作者:International Topical Conference on Electron Beam Research and Technology、 Albuquerque、 N. M.、 1975.、Yonas、 Gerold.、Sandia Laboratories.、United States. Energy Research and Development Administration.、 出版社:[Albuquerque, N.M.] : Sandia Laboratories ; Springfield, Va. : available from National Technical Information Service, U.S. Dept. of Commerce, 1976.
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0 索取号:TN019.2-7/E801/1975 作者:IEEE MTT-S International Microwave Symposium (1975 : Palo Alto、 Calif.)、Lepoff、 Jack H、Institute of Electrical and Electronics Engineers、 出版社:Piscataway, N.Y. : Institute of Electrical and Electronics Engineers, c1975
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0 索取号:TN019.2/E806/1972 作者:IEEE-GMTT International Microwave Symposium (1972 : Arlington Heights、 IL).、Book、 Eric G.、Institute of Electrical and Electronics Engineers.、IEEE Microwave Theory and Techniques Group.、 出版社:New York : Institute of Electrical and Electronics Engineers, 1972.
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0 索取号:TN-7/E801/1977 作者:International Electrical、 Electronics Conference and Exposition (1977 : Toronto、 Ont.)、Institute of Electrical and Electronics Engineers. Canadian Region.、 出版社:[s.l : IEEE, 1977]
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0 索取号:X-012.658/E20041 作者:KʻУang、 Mei-tzʻУ.、Hong Kong Centre for Economic Research.、 出版社:Hong Kong : Published for Hong Kong Centre for Economic Research by Chinese University Press, c1990.
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0 索取号:F632.765.8/E20031 作者:Mueller、 Milton、 出版社:Hong Kong : The Chinese University of Hong Kong Presse, 1991
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